Simulation and measurement of the self-heating in GaN HFETs

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1002/pssc.200674252
AuthorSearch for: 1
Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
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PublisherWiley
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LanguageEnglish
Peer reviewedYes
NPARC number12743873
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Record identifier85559cec-3da4-497a-be62-9bb95f1f1d2a
Record created2009-10-27
Record modified2020-05-10
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