Simulation and measurement of the self-heating in GaN HFETs
Simulation and measurement of the self-heating in GaN HFETs
| DOI | Resolve DOI: https://doi.org/10.1002/pssc.200674252 |
|---|---|
| Author | Search for: 1 |
| Affiliation |
|
| Format | Text, Article |
| Publication date | 2007 |
| Publisher | Wiley |
| In | |
| Language | English |
| Peer reviewed | Yes |
| NPARC number | 12743873 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 85559cec-3da4-497a-be62-9bb95f1f1d2a |
| Record created | 2009-10-27 |
| Record modified | 2020-05-10 |
- Date modified: