| Download | - View author's version: Field assisted reactive gas etching of multiple tips observed using FIM (PDF, 810 KiB)
- View supplementary information: Field assisted reactive gas etching of multiple tips observed using FIM (PDF, 1.2 MiB)
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| DOI | Resolve DOI: https://doi.org/10.1016/j.ultramic.2021.113216 |
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| Author | Search for: Ahmed, Rezwan; Search for: Urban, Radovan; Search for: Salomons, Mark1; Search for: Cloutier, Martin1; Search for: Mizuno, Seigi; Search for: Wolkow, Robert; Search for: Pitters, Jason1 |
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| Affiliation | - National Research Council Canada. Nanotechnology
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| Format | Text, Article |
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| Subject | field ion microscopy; tungsten tips; field emission; nanotips; single atom tips |
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| Abstract | A simple and cost effective method to fabricate multiple tungsten (W) single atom tips (SATs) from both poly and single crystalline wires is reported. Two or four tips attached to a holder are electrochemically etched together in NaOH solution followed by a controlled field assisted reactive gas etching in vacuum using nitrogen as an etching gas and helium as an imaging gas. A Common high voltage is applied simultaneously to all nanotips to shape the apexes towards single atoms. Single atom tips were achieved for both W(111) and W(110) while trimer tips were also achieved for W(111). This observation can lead to an important step towards realizing simplified etching processes of multiple tips which in turn can help to simultaneously fabricate numerous tips leading to mass fabrication and characterization. |
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| Publication date | 2021-01-21 |
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| Publisher | Elsevier |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NRC number | NRC-NANO-87 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 802173cb-33c3-4f76-a997-5cbd6c3fd7dc |
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| Record created | 2021-03-16 |
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| Record modified | 2021-03-16 |
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