Traceability and metrological equivalence
Traceability and metrological equivalence
| Author | Search for: |
|---|---|
| Sponsor | Search for: NCSL International; Search for: NCSLI |
| Format | Text, Article |
| Conference | NCSL International 2000 Workshop and Symposium : metrology, intangible, imbedded support? : conference proceedings, July 16-20, 2000, Toronto, Ontario, Canada |
| Language | English |
| NRC number | NRC-INMS-827 |
| NPARC number | 8898448 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 7bba8a2b-57ed-406f-a517-89b54f4335f5 |
| Record created | 2009-04-22 |
| Record modified | 2020-04-16 |
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