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Quantum metrology with photoelectrons. Volume 1: Foundations

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1088/978-1-6817-4684-5
AuthorSearch for: 1
Affiliation
  1. National Research Council of Canada. Security and Disruptive Technologies
FormatText, Book
ISBN978-1-6817-4684-5
Abstract
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.
Publication date
PublisherIOP Publishing
LanguageEnglish
Peer reviewedYes
NPARC number23004232
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Record identifier77499f5e-e42a-450a-b6d2-5dc8fb303017
Record created2018-10-12
Record modified2020-03-02
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