| Download | - View final version: Transmission electron microscopy imaging and spectroscopy of nanomaterials (PDF, 164 KiB)
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| Author | Search for: Malac, Marek1 |
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| Affiliation | - National Research Council Canada. Security and Disruptive Technologies
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| Format | Text, Address |
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| Conference | Institute of Physics, Czech Academy of Sciences, June 27th, 2016, Prague, Czech Republic |
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| Physical description | 1 p. |
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| Abstract | Transmission electron microscope (TEM) has been used for materials characterizations for decades. With the interest in nanoscience and nanotechnology the possibility to reveal morphology, structure and physical properties at nearly atomic resolution led to vigorous development of TEM methods. Here we will discuss two methods in particular: the momentum resolved electron energy loss spectroscopy (qEELS) and hole free phase plate imaging in TEM. Both methods can be combined with all analytical capabilities of a modern TEM providing insights into material structure relation to its properties. |
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| Publication date | 2016-06-27 |
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| Publisher | Institute of Physics, Czech Academy of Sciences |
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| Language | English |
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| Peer reviewed | No |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 729c303e-a65f-47cf-afa8-00b55279adb1 |
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| Record created | 2020-05-29 |
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| Record modified | 2020-05-29 |
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