| DOI | Resolve DOI: https://doi.org/10.1017/S1431927618005731 |
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| Author | Search for: Homeniuk, Darren1; Search for: Malac, Marek1; Search for: Hayashida, Misa1 |
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| Affiliation | - National Research Council Canada. Nanotechnology
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| Format | Text, Article |
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| Conference | Microscopy & Microanalysis 2018, August 5-9, 2018, Baltimore, Maryland, United States |
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| Abstract | An important observable characteristic of a buried interface between layers or surface of a film is the interface roughness (IR). Here we present a continuous wavelet transform (CWT) description of the interface roughness as an alternative to the traditional root-mean-square (RMS) roughness. |
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| Publication date | 2018-08-01 |
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| Publisher | Cambridge University Press |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 68f99e19-01ae-4bcf-b136-093361ee1e9b |
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| Record created | 2020-01-21 |
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| Record modified | 2024-05-15 |
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