Ellipsometric Characterization of the Optical Constants of Metals: Thin Film vs Nanoparticle
Ellipsometric Characterization of the Optical Constants of Metals: Thin Film vs Nanoparticle
| Alternative title | Metallization of Polymers 2 |
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| Author | Search for: 1; Search for: |
| Editor | Search for: Sacher, E. |
| Affiliation |
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| Format | Text, Article |
| Publication date | 2002 |
| Publisher | Plenum Press |
| NPARC number | 12346775 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 66e4cc8e-b6c9-44d8-b755-931358b9ec13 |
| Record created | 2009-09-17 |
| Record modified | 2020-03-30 |
- Date modified: