Advancing PIC development using machine learning: from design to fabrication to optical characterization
Advancing PIC development using machine learning: from design to fabrication to optical characterization
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| Link | https://ieeexplore.ieee.org/document/11046953 |
| Author | Search for: 1ORCID identifier: https://orcid.org/0000-0002-0490-5224; Search for: 2ORCID identifier: https://orcid.org/0000-0003-3349-1590; Search for: 1; Search for: 3ORCID identifier: https://orcid.org/0000-0003-3525-2980; Search for: 1ORCID identifier: https://orcid.org/0000-0002-4851-3257; Search for: 1; Search for: 1; Search for: 1; Search for: 1ORCID identifier: https://orcid.org/0000-0003-4232-9130; Search for: 1ORCID identifier: https://orcid.org/0000-0003-3508-7428; Search for: ; Search for: ; Search for: ; Search for: ORCID identifier: https://orcid.org/0000-0001-9323-4452; Search for: ; Search for: |
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| Format | Text, Article |
| Conference | 2025 Optical Fiber Communication Conference and Exhibition (OFC), March 30 - April 3, 2025, San Francisco, California, United States |
| Subject | learning systems; machine learning; photonics |
| Abstract | |
| Publication date | 2025-07-04 |
| Publisher | Optica Publishing Group IEEE |
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| Language | English |
| Peer reviewed | Yes |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 63da848f-7d4e-48ce-92f7-e38a73f0ea43 |
| Record created | 2025-07-31 |
| Record modified | 2025-08-01 |
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