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Three-dimensional imaging metrology: 19-20 January 2009, San Jose, California, USA

From National Research Council Canada

Linkhttp://spie.org/Publications/Proceedings/Volume/7239
EditorSearch for: Beraldin, J. Angelo1; Search for: Cheok, Geraldine S.; Search for: McCarthy, Michael B.
Affiliation
  1. National Research Council of Canada
FormatText, Book
ConferenceIS&T/SPIE Electronic Imaging, Science and Technology, 19-20 January 2009, San Jose, California, USA
ISBN9780819474896
Abstract
First conference on 3D Imaging Metrology.
Publication date
PublisherSPIE
Series
  • Proceedings of SPIE, no. 7239.
LanguageEnglish
Peer reviewedYes
NPARC number23001667
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Record identifier6128f49b-9e6d-422d-8754-8ef1af4607cd
Record created2017-03-16
Record modified2020-03-02
Date modified: