In-situ Monitoring of Residual Stress Development During E-Beam Processing
In-situ Monitoring of Residual Stress Development During E-Beam Processing
| Author | Search for: 1; Search for: 1; Search for: 2; Search for: 3 |
|---|---|
| Affiliation |
|
| Format | Text, Article |
| Conference | SAMPE 2004 - 49th International SAMPE Symposium From 5/18/2004 To 5/20/2004, Long Beach, CA |
| Subject | Composites; Polymers; Electron Beam Curing; Process Modelling; Residual Stress |
| Access condition |
|
| Peer reviewed | Yes |
| NRC number | SMPL-2004-0039 |
| NPARC number | 8927652 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 5e684a82-176b-4551-ae10-ecc114e6a31e |
| Record created | 2009-04-23 |
| Record modified | 2020-04-16 |
- Date modified: