Spontaneous emission and reflectivity measurements for the characterization of facet-coatings of semiconductor lasers

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1109/PN.2015.7292494
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Name affiliation
  1. National Research Council Canada. Information and Communication Technologies
FormatText
TypeArticle
Proceedings title2015 Photonics North
Conference2015 Photonics North, June 9-11, 2015, Ottawa, Ontario Canada
ISBN978-1-4673-6805-6
Pages11
SubjectLaser coating; Spontaneous emission; Reflectivity;; Laser characterization
Abstract
Publication date
PublisherIEEE
LanguageEnglish
Peer reviewedYes
NPARC number23000104
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Record created2016-06-02
Record modified2016-06-02
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