Spontaneous emission and reflectivity measurements for the characterization of facet-coatings of semiconductor lasers

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1109/PN.2015.7292494
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  1. National Research Council of Canada. Information and Communication Technologies
FormatText, Article
Conference2015 Photonics North, June 9-11, 2015, Ottawa, Ontario Canada
SubjectLaser coating; Spontaneous emission; Reflectivity; Laser characterization
Publication date
Peer reviewedYes
NPARC number23000104
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Record identifier58cb3a82-6cbc-4c19-918e-83859d6b3f8a
Record created2016-06-02
Record modified2020-04-22
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