| Download | - View accepted manuscript: Exploiting the precision and accuracy of powder diffraction profiles with appropriately parameterized Rietveld refinement models (PDF, 2.3 MiB)
|
|---|
| Author | Search for: Mercier, P. H. J.1; Search for: Le Page, Y.1; Search for: Whitfield, P. S.1; Search for: Mitchell, L. D.2 |
|---|
| Affiliation | - National Research Council Canada. NRC Institute for Chemical Process and Environmental Technology
- National Research Council Canada. NRC Institute for Research in Construction
|
|---|
| Format | Text, Address |
|---|
| Conference | 2009 ACA Meeting, 26 July 2009, Toronto, Canada |
|---|
| Publication date | 2009-07-26 |
|---|
| Language | English |
|---|
| Peer reviewed | No |
|---|
| NRC number | NRCC 52049 |
|---|
| NPARC number | 15329271 |
|---|
| Export citation | Export as RIS |
|---|
| Report a correction | Report a correction (opens in a new tab) |
|---|
| Record identifier | 580c2bb5-67f9-49e2-8fcb-214fed317eab |
|---|
| Record created | 2010-05-19 |
|---|
| Record modified | 2020-03-03 |
|---|
