Specimen charging measured by off-axis electron holography
Specimen charging measured by off-axis electron holography
| Author | Search for: ; Search for: ; Search for: 1 |
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| Affiliation |
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| Format | Text, Poster |
| Conference | Microscopy for Global Challenges, Touching Atoms, Molecules, Nanostructures and Cells by Multidimensional Microscopy (18th International Microscopy Congress), Sept. 7-12, 2014, Prague, Czech Republic |
| Physical description | 2 p. |
| Publication date | 2014-09-12 |
| Publisher | Czechoslovak Microscopy Society |
| In | |
| Language | English |
| Peer reviewed | Yes |
| Identifier | IT-11-P-1954 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 4ef2958f-7948-47be-83f9-9ed625a0dfee |
| Record created | 2020-02-28 |
| Record modified | 2020-03-02 |
- Date modified: