Scattering lifetimes due to interface roughness with large lateral correlation length in a Al1-xGaxN/GaN two-dimensional electron gas
Scattering lifetimes due to interface roughness with large lateral correlation length in a Al1-xGaxN/GaN two-dimensional electron gas
| DOI | Resolve DOI: https://doi.org/10.1103/PhysRevB.66.245305 |
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| Author | Search for: 1; Search for: 2; Search for: ; Search for: 1; Search for: ; Search for: ; Search for: 1 |
| Affiliation |
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| Format | Text, Article |
| Publication date | 2002 |
| In | |
| Language | English |
| Peer reviewed | Yes |
| NPARC number | 12327945 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 49c5cd04-bebb-4821-a90f-49e4ccb0bc2a |
| Record created | 2009-09-10 |
| Record modified | 2020-04-06 |
- Date modified: