Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film

From National Research Council Canada

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Name affiliation
  1. National Research Council of Canada. National Institute for Nanotechnology
FormatText, Article
Journal titleMicron
Subjecthole-free phase plate; volta phase plate; radiation damage; electron beam induced charging; thon rings; fresnel images
Publication date
Peer reviewedYes
NPARC number23002388
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Record identifier495b88f1-4caf-48fe-84be-813576183067
Record created2017-10-26
Record modified2020-03-16
Date modified: