| DOI | Resolve DOI: https://doi.org/10.1002/1096-9918(200008)30:1<207::AID-SIA816>3.0.CO;2-5 |
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| Author | Search for: Bensebaa, Farid1; Search for: Kotlyar, Luba1; Search for: Pleizier, Gerald1; Search for: Sparks, Bryan1; Search for: Deslandes, Yves1; Search for: Chung, Keng |
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| Affiliation | - National Research Council of Canada. NRC Institute for Chemical Process and Environmental Technology
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| Format | Text, Article |
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| Subject | bitumen; end cut; surface; XPS; ToF-SIMS; FTIR |
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| Abstract | Bitumen components, responsible for various processing problems, were analysed with x-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and photoacoustic Fourier transform infrared spectrometry (PAS–FTIR). These methods were selected because they can probe surfaces to different depths: ToF-SIMS explores the surface to a depth of ~1 nm; XPS analyses a surface layer 7 nm deep; and PAS–FTIR probes layers several micrometres thick. |
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| Publication date | 2000-09-05 |
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| Publisher | Wiley |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NRC number | NRCC 51877 |
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| NPARC number | 13063727 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 465d9a4c-2ed8-41ed-b3b0-12585e80eb1d |
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| Record created | 2009-12-03 |
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| Record modified | 2022-03-10 |
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