Download | - View accepted manuscript: Cell to aperture interaction in Patch-Clamp Chips visualized by Fluorescence microscopy and Focused-Ion Beam sections (PDF, 1.0 MiB)
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DOI | Resolve DOI: https://doi.org/10.1002/bit.23127 |
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Author | Search for: Py, Christophe1; Search for: Salim, Danish1; Search for: Monette, Robert2; Search for: Comas, Tanya2; Search for: Fraser, Jeffrey1; Search for: Martinez, Dolores1; Search for: Martina, Marzia2; Search for: Mealing, Geoffrey2 |
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Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
- National Research Council of Canada. NRC Institute for Biological Sciences
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Format | Text, Article |
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Subject | ion channels; planar patch-clamp chip; gigaseal; fluorescence microscopy; focused ion beam; scanning electron microscopy |
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Abstract | Patch-clamp is an important method to monitor the electrophysiological activity of cells and the role of pharmacological compounds on specific ion channel roteins. In recent years, planar patch-clamp chips have been developed as a higher throughput approach to the established glass-pipette method. However, proper conditions to optimize the high resistance cell-to-probe seals required to measure the small currents resulting from ion channel activity are still the subject of conjecture. Here, we report on the design of multiple-aperture (sieve) chips to rapidly facilitate assessment of cell-to-aperture interactions in statistically significant numbers. We propose a method to prescreen the quality of seals based on a dye loading protocol through apertures in the chip and subsequent evaluation with fluorescence confocal microscopy. We also show the first scanning electron micrograph of a focused ion beam section of a cell in a patch-clamp chip aperture. |
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Publication date | 2011-03-09 |
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In | |
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Language | English |
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Peer reviewed | Yes |
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NPARC number | 18074298 |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | 460ff7b3-d06c-495d-9314-2f2adc0684b7 |
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Record created | 2011-06-23 |
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Record modified | 2020-04-21 |
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