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The characterization of oxides formed on InP,InGaAs,InAlAs and InGaAs/InAlAs heterostructures at 300-500ºC

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1023/A:1015396204143
AuthorSearch for: ; Search for: 1; Search for: 2; Search for: 1
Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
  2. National Research Council of Canada. NRC Institute for National Measurement Standards
FormatText, Article
Publication date
In
  • Oxidation of metals 57, no. 5-6 (2002): 427–447.
NPARC number12744875
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Record identifier44c7b966-b576-471f-82d9-9600c111de7f
Record created2009-10-27
Record modified2020-03-30
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