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Scanning tunneling microscopy images of IIIV semiconductor alloys: strain effects

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1116/1.1529651
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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
FormatText, Article
Publication date
In
  • Journal of Vacuum Science & Technology B 21, no. 1 (2003): 18–22.
NPARC number12744628
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Record identifier42ca7a48-84ae-449f-bdf0-b8382f3bc569
Record created2009-10-27
Record modified2020-04-02
Date modified: