| Author | Search for: Malac, Marek1 |
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| Affiliation | - National Research Council of Canada. Security and Disruptive Technologies
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| Format | Text, Address |
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| Conference | 87th AMCP Open Seminar, Nov. 14th, 2016, National Institute for Materials Science, Tsukuba, Japan |
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| Abstract | Zernike-like phase plate contrast can be obtained in a transmission electron microscope by introducing a phase shift between direct and diffracted beams in the back focal plane of objective lens. A particularly convenient implemenation utilizes a uniform thin film with its contrast transfer properties determined by local modifications of the film by the primary electron beam. The need for accurate positioning of the device in back focal plane is eliminated because the phase shifting patch size and position is determined by the primary beam size and position. Such hole free phase plate can increase image contrast by a factor of two to four. While hole free phase plate contrast can not be quantitatively interpreted at present, it can be used to image for example magnetic field inside sample and fringing field in vacuum near sample. It can be also applied to imaging of biological materials. The origin of the hole free phase plate phase shift is not fully understood. In this prentation, example applications and recent development of the contrast origin will be discussed. |
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| Publication date | 2016-11-14 |
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| Publisher | National Research Council of Canada |
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| Language | English |
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| Peer reviewed | No |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 2b43c8e7-f086-4689-9ad7-400f3d500f58 |
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| Record created | 2020-06-09 |
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| Record modified | 2022-06-10 |
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