| Download | - View final version: Fabrication aware design of sensitive silicon photonics devices (PDF, 678 KiB)
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| DOI | Resolve DOI: https://doi.org/10.1117/12.2692673 |
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| Author | Search for: Liboiron-Ladouceur, Odile; Search for: Gostimirovic, DusanORCID identifier: https://orcid.org/0000-0001-9323-4452; Search for: Xu, Dan-Xia1ORCID identifier: https://orcid.org/0000-0002-0490-5224; Search for: Grinberg, Yuri2ORCID identifier: https://orcid.org/0000-0003-3349-1590; Search for: Xun, Chenxin; Search for: Darby, James; Search for: Zhao, Bokun |
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| Editor | Search for: He, Sailing; Search for: Vivien, Laurent |
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| Affiliation | - National Research Council Canada. Digital Technologies
- National Research Council Canada. Quantum and Nanotechnologies
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| Format | Text, Article |
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| Conference | Smart Photonic and Optoelectronic Integrated Circuits 2024, January 29 - February 1, 2024, San Francisco, California, United States |
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| Subject | silicon photonics; nanophotonics; advanced nanomanufacturing; topological optimization; AI/ML applications in predictive analytics |
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| Abstract | Since the turn of the century, Silicon Photonics (SiPh) has advanced data communication and computing via diverse integrated optical functions and multiplexing strategies. However, conventional design methodologies limit scalability, and inverse designs lead to features sensitive to fabrication process variations. This talk explores the harnessing of machine learning (ML) to predict and rectify these deviations in the design phase. This technique enhances design fidelity and device performance, while facilitating smaller design features, bypassing constraints of traditional methods. Highlighting PreFab, an innovative ML technology, applicable to both conventional and inverse designs, it predicts and corrects fabrication deviations, enabling refined design processes. |
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| Publication date | 2024-03-08 |
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| Publisher | Society of Photo-Optical Instrumentation Engineers (SPIE) |
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| Licence | - Copyright 2024 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited.
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 2ab10d65-c2ec-4c34-9235-0784c9d2565b |
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| Record created | 2025-01-07 |
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| Record modified | 2025-01-08 |
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