Properties of InAlP Native Oxides Suorting MOS Inversion-layer Behavior

Author	Search for: Barrios, P.; Search for: Hall, D.; Search for: Chowdhury, U.; Search for: Dupuis, R.; Search for: Jasinski, J.; Search for: Liliental-Weber, Z.; Search for: Kosel, T.; Search for: Snider, G.
Format	Text, Article
Conference	43rd Electronic Materials Conference, June 27-29 2001, Notre Dame, Indiana
NPARC number	12346233
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Record identifier	280608c4-8784-4d59-930a-f5c74ec9b2d4
Record created	2009-09-17
Record modified	2020-04-16