In situ synchrotron X-ray diffraction analysis of phase transformation in epitaxial metastable hcp nickel thin films, prepared via plasma-enhanced atomic layer deposition

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1002/admi.201800957
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  1. National Research Council Canada. Nanotechnology
FormatText
TypeArticle
Journal titleAdvanced Materials Interfaces
ISSN2196-7350
Volume5
Issue24
Article number1800957
Abstract
Publication date
PublisherWiley
LanguageEnglish
Peer reviewedYes
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Record identifier21fc0070-2b81-4fea-9e92-6b978ae6a6e2
Record created2019-04-17
Record modified2019-04-17
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