Origin of bright field TEM contrast enhancement by a hole-free phase plate
Origin of bright field TEM contrast enhancement by a hole-free phase plate
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| Affiliation |
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| Format | Text, Address |
| Conference | 17th International Microscopy Congress, September 2010, Rio de Janeiro, Brazil |
| Publication date | 2010-09 |
| Publisher | International Federation of Societies for Microscopy |
| Language | English |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 21de7cae-4a9f-43f2-ab7b-cdfde839f048 |
| Record created | 2021-09-03 |
| Record modified | 2021-09-14 |
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