| DOI | Resolve DOI: https://doi.org/10.1117/12.2666064 |
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| Author | Search for: Korcek, Radovan; Search for: Cheben, Pavel1ORCID identifier: https://orcid.org/0000-0003-4232-9130; Search for: Alonso-Ramos, Carlos; Search for: Vivien, Laurent; Search for: Benedikovic, Daniel |
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| Affiliation | - National Research Council of Canada. Quantum and Nanotechnologies
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| Format | Text, Article |
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| Conference | Integrated Optics: Design, Devices, Systems, and Applications VII, April 24-28, 2023, Prague, Czech Republic |
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| Subject | optical gratings; silicon nitride; optical design; waveguides; fabrication; optical fibers; finite-difference time-domain method; apodization; polarization gratings; silicon |
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| Abstract | Silicon nitride (SiN) has emerged as an important waveguide platform to implement integrated photonic circuits for a wide range of applications, including telecommunications, nonlinear optics, and quantum information. The SiN platform is compatible with a CMOS fabrication and provides attractive properties such as low propagation loss and increased tolerance to fabrication errors. However, a comparatively low index contrast is a challenge for coupling light off-chip using surface grating couplers. Compared to silicon waveguides, reduced grating scattering strength limits attainable coupling efficiency since the size of the radiating beam is significantly larger compared to near-Gaussian optical mode of standard SMF-28 optical fibers. In this work, we present, both theoretically and experimentally, a set of robust uniform and apodized grating couplers implemented in 400 nm SiN platform. Grating couplers operate with TE polarization at telecom C-band, with measured coupling losses between -4 dB to -3 dB near 1550 nm wavelength. Prospectively, our designs can be further optimized by using sub-wavelength grating metamaterial engineering and self-focusing topology, with simulated fiber-chip coupling loss as low as -1.6 dB. Our results pave the way towards development of highly efficient and robust off-chip coupling interfaces in SiN platform. |
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| Publication date | 2023-05-31 |
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| Publisher | SPIE |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 1ee77ca6-0195-40db-a0c2-142ec107f8d6 |
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| Record created | 2024-10-30 |
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| Record modified | 2024-10-30 |
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