| DOI | Resolve DOI: https://doi.org/10.1109/TCAD.2022.3174165 |
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| Author | Search for: Fu, MingyeORCID identifier: https://orcid.org/0000-0003-4736-9107; Search for: Jiang, Nianhua1ORCID identifier: https://orcid.org/0000-0001-6265-5190; Search for: Bornemann, JensORCID identifier: https://orcid.org/0000-0002-5168-7258; Search for: Feng, QuanyuanORCID identifier: https://orcid.org/0000-0003-4139-2015 |
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| Affiliation | - National Research Council Canada. Herzberg Astronomy and Astrophysics
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| Funder | Search for: Key Project of the National Natural Science Foundation of China; Search for: Sichuan Provincial Science and Technology Important Projects; Search for: China Scholarship Council |
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| Format | Text, Article |
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| Subject | amplifier design; backside via hole; electromagnetic (EM)-circuit co-simulation; monolithic microwave-integrated circuit (MMIC); transistor; integrated circuit modeling; layout; solid modeling; coplanar waveguides; gallium arsenide; computational modeling |
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| Abstract | A discrepancy of monolithic microwave-integrated circuit (MMIC) amplifier simulations is discussed for conventional electromagnetic (EM) circuit co-simulation in advanced design system (ADS). An obvious discrepancy occurs when microstrip (MS) type transistor schematic models are used in a high gain MMIC amplifier. The coupling effect of a backside via hole in the MS-type model, which is excluded from EM layout simulation, is demonstrated to be the root of this error that will become significant in high-gain MMIC amplifier design. A new method is proposed to include a source via hole of the MS-type transistor in MMIC layout EM simulations. Simulation experiments confirm that this new method can significantly improve the EM simulation accuracy when including a transistor source via hole in the circuit layout EM simulation. The intercoupling effect of the transistor source via is investigated on the correlation with frequency, current gain, via separation distance, and substrate thickness. |
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| Publication date | 2022-05-10 |
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| Publisher | IEEE |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 1654ae44-00ff-41a9-ad01-d8704215e98c |
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| Record created | 2023-09-05 |
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| Record modified | 2023-09-05 |
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