Reconsidering X-ray photoelectron spectroscopy quantification of substitution levels of monolayers on unoxidized silicon surfaces

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1021/acs.jpcc.0c04101
AuthorSearch for: 1ORCID identifier: https://orcid.org/0000-0002-1140-9907; Search for: 1ORCID identifier: https://orcid.org/0000-0003-1623-0102; Search for: 1ORCID identifier: https://orcid.org/0000-0002-9567-4328
Name affiliation
  1. National Research Council of Canada. Nanotechnology
FunderSearch for: Canada Research Chairs; Search for: University of Alberta; Search for: Natural Sciences and Engineering Research Council of Canada; Search for: Alberta Innovates - Technology Futures
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PublisherAmerican Chemical Society
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LanguageEnglish
Peer reviewedYes
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Record identifier1553e6fb-04d3-489c-8d0c-67c22ab8013f
Record created2022-06-25
Record modified2022-06-25
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