Advanced electron microscopy characterization at National Institute for Nanotechnology
Advanced electron microscopy characterization at National Institute for Nanotechnology
| Author | Search for: 1 |
|---|---|
| Affiliation |
|
| Format | Text, Address |
| Conference | 89th Canadian Chemistry Conference, May 27-31, 2006, Halifax, Nova Scotia, Canada |
| Publication date | 2006 |
| Language | English |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 05d0e398-ff31-4211-9f3c-1f7710f9c864 |
| Record created | 2021-09-27 |
| Record modified | 2021-09-27 |
- Date modified: