Advanced electron microscopy characterization at National Institute for Nanotechnology
Advanced electron microscopy characterization at National Institute for Nanotechnology
Author | Search for: 1 |
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Affiliation |
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Format | Text, Address |
Conference | 89th Canadian Chemistry Conference, May 27-31, 2006, Halifax, Nova Scotia, Canada |
Publication date | 2006 |
Language | English |
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Record identifier | 05d0e398-ff31-4211-9f3c-1f7710f9c864 |
Record created | 2021-09-27 |
Record modified | 2021-09-27 |
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