Automated defect and correlation length analysis of block copolymer thin film nanopatterns

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DOIResolve DOI: https://doi.org/10.1371/journal.pone.0133088
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  1. National Research Council of Canada. National Institute for Nanotechnology
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PublisherPublic Library of Science
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LanguageEnglish
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NPARC number23000676
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Record identifier05a10406-2d39-44a8-8305-fc22b481da81
Record created2016-08-22
Record modified2020-06-02
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